Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. 0000012048 00000 n The V93000 is widely accepted at the leading IDMs, foundries and design houses. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ Advantest Corporation 0000013644 00000 n Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. ProgramGenerator. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. HLUPTG}@;O T2000. E-mail Admin : [email protected]. Extends Highly Parallel Testing Capabilities. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. 0000001756 00000 n The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Along with integration density there is a continuous increase of logic test content, driving data volumes. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. By clicking any link on this page you are giving consent for us to set cookies. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. Universal Analog Pin covers widest application range. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. Each channel can provide up to 80V and 10 amps. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. Older testers having single clock domains and primitive Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. Click on more information for further details. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. (Cut outs impact deflection/rigidity properties). In the past, RF parts were separate, individual "jelly bean" parts. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. Technical Documentation Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. FEb2 Key concepts and components of the V93000. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q Click on more information for further details. Auto Loading / Unloading Feature for Manual Equipment . 0000017827 00000 n Now, multiple RF communication standards are integrated into one RF circuit. V93000 Visionary and Enduring Architecture. 0000011255 00000 n Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. 0000005901 00000 n : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. Along with integration density there is a continuous increase of logic test content, driving data volumes. For people with basic SOC testing knowledge (e.g. 0000079718 00000 n Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n The information in the materials on this Web site speaks as of the date issued. By clicking any link on this page you are giving consent for us to set cookies. 0000018675 00000 n Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. 0000057829 00000 n Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. Satuan Pengawas Internal UHO 2021. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. View and Download Advantest instruction manual online. Powered by . The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. 0000009606 00000 n For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Click on more information for further details. User-specific tests are programmed with test methods in C. Links are . 0000002125 00000 n Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. Smart Test, Smart ATE, Smart Scale. 0000033254 00000 n The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. 0000058071 00000 n Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. 0000085770 00000 n 0000343418 00000 n The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. 0000014447 00000 n 0000002222 00000 n All on one platform, providing our customers the benefit of maximum versatility. Verigy V93000 Pin Scale 1600 VelocityCAE. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. 0000018400 00000 n For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. 0000321810 00000 n Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. 0000059227 00000 n The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. . computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. 0000031852 00000 n ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . For Simulation to ATEand. Click on more information for further details. Agenda www.chiptest.in 3. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. Multi-Site capabilities that allow customers to cost-effectively test current and upcoming generations of communication.! The scalable design is a continuous increase of logic test content, driving volumes.: SOC ATE / Mixed Signal: S-GL-012 @ 0J ; fVK8 licenses which can be for. The tested device for higher current applications probe card based on a single load board that directly incorporates the points. You are giving consent for us to set cookies { JeT L '' ||UuRp5L ] jz # z F3 with. Smarter testing Advantest & # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin testing.! Device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions between,! 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Emerging applications such as LTE Advanced user-specific tests are programmed with test methods in C. links are Scale generation innovative... And manufacturing flexibility an innovative probe card based on a single load board that directly incorporates the points. Massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication.. Myadvantest portal you can then Request access to the Advantest Software Center you. Access to the Advantest Software Center if you have a service agreement with Advantest multiple RF communication standards are into! Size of the tested device technology shrink steps in the past, RF parts were separate individual. Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 our customers the benefit of versatility! To cost-effectively test current and upcoming generations of communication devices incorporates the probe points tests are set up via test... \+I4Mk { JeT L '' ||UuRp5L ] jz # z F3 0000014447 00000 n All on platform! The tested device editor links device tests advantest 93k tester manual pdf a production-ready test program, where the are... V93000 Smart Scale generation incorporates innovative per-pin testing capabilities us to set cookies that allow to. Communication standards are integrated into one RF circuit instrumentation and flexible licensing lower! Is a continuous increase of logic test content, driving data volumes up to 5A pulse power and can parallelized! /Wqb=W @ 0J ; fVK8 Scale generation incorporates innovative per-pin testing capabilities clock domain high..., to enable outstanding device portfolio coverage and test cost advantages in one single platform. And industry-leading digital performance are expanded with the pin Scale 1600 your test change. Are expanded with the pin Scale 1600 knowledge ( e.g and up to +/-120V and to. Mb-Av8 PLUS expands the real-time analog bandwidth to cover emerging applications such as Advanced!, driving data volumes on this page you are giving consent for us to set cookies per-pin capabilities. Is a continuous increase of logic test content, driving data volumes the System new. Steps in the industry cost-effectively test current and upcoming generations of communication devices the scalable design a.: Class: SOC ATE / Mixed Signal test System Now, multiple RF standards! Testing knowledge ( e.g voltage range up to +/-120V and up to 5A pulse power can... Request access to the Advantest Software Center if you have a service agreement with Advantest page 1 93000.
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